Description
E series prober has excellent mechanical system, stable structure and performance, ergonomic design, more convenient operation, support multi-function upgrade, more abundant product functions. The product is mainly used in the manufacturing and research fields of integrated circuit,LED,LCD, solar cell and other industries.
LD/LED/PD Light intensity/wavelength test electrode /PAD test PCB/ package device Test material/device IV/CV characteristic test device high-frequency characteristic test (up to 300GHZ frequency) rf test, etc.
POMater™ Adaptive shock absorbing base
The self-adaptive shock-absorbing base is designed with imported shock-absorbing materials from Germany to enhance elastic support, to achieve different degrees of rigidity, hardness and bearing range, and effectively filter vibration source interference in the environment to ensure stable contact between the probe end and the Pad of the sample, improving the stability of the test.
The chuck can be adjusted lifting
The chuck can be adjusted lifting, the stroke is 5mm, and the accuracy is 10μm, which is convenient for the sample to quickly separate the probe.
Pneumatic fast lifting of microscope
The microscope is pneumatically quickly lifted, which is convenient to replace the microscope and the probe card holder.
